MAUD
MAUD stands for Material Analysis Using Diffraction. It is a general diffraction/reflectivity/fluorescence analysis program mainly based on the Rietveld method, but not limited to.
The main features are:
Written in Java can run on Windows, MacOSX, Linux, Unix (need Java VM 1.6 or later)
Easy to use, every action is controlled by a GUI
Works with X-ray, synchrotron, Neutron, TOF, electrons
Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
Ab-initio structure solution integration, from peak finding, indexing to solving
Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics)
Le Bail fitting
Quantitative phase analysis
Microstructure analysis (size-strain, anisotropy and distributions included)
Texture and residual stress analysis using part or full spectra
MEEM and superflip algorithm for Electron Density Maps and fitting
Thin film and multilayer aware; film thickness and absorption models
Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
Works with TEM diffraction images and electron scattering
Several data files input formats
Works and input images from 2D detectors (image plates, CCD)
CIF compliance for input/output; import structures from databases
The main features are:
Written in Java can run on Windows, MacOSX, Linux, Unix (need Java VM 1.6 or later)
Easy to use, every action is controlled by a GUI
Works with X-ray, synchrotron, Neutron, TOF, electrons
Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
Ab-initio structure solution integration, from peak finding, indexing to solving
Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics)
Le Bail fitting
Quantitative phase analysis
Microstructure analysis (size-strain, anisotropy and distributions included)
Texture and residual stress analysis using part or full spectra
MEEM and superflip algorithm for Electron Density Maps and fitting
Thin film and multilayer aware; film thickness and absorption models
Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
Works with TEM diffraction images and electron scattering
Several data files input formats
Works and input images from 2D detectors (image plates, CCD)
CIF compliance for input/output; import structures from databases