64th Annual Denver X-ray Conference (DXC2015) and 16th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2015).

Aug 3 2015 | 12am - Aug 7 2015 | 12am

In Westminster, CO

Applied crystallography Art and history Characterisation of materials General Industrial crystallography Neutron scattering Powder diffraction X-ray fluorescence

http://www.dxcicdd.com/

Contact:

Denise Zulli

[email protected]

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