Metadata for raw data from X-ray diffraction and other structural techniques

ECM29 satellite meeting organised by John R. Helliwell (University of Manchester), Brian McMahon (IUCr) and Aleksandar Višnjevac (Croatian Association of Crystallographers)

As part of the continuing activities of the IUCr Diffraction Data Deposition Working Group, this workshop will seek to define the necessary metadata that needs to be captured and deposited alongside experimental diffraction images in order that such raw data may be subsequently re-evaluated or re-used in more detailed scientific studies. The workshop will also explore the metadata requirements of other structural experimental techniques used by crystallographers.

Confirmed speakers: Loes Kroon-Batenburg, Utrecht University, The Netherlands; Simon Coles, Southampton University and UK Crystallography Service, UK; John Helliwell, University of Manchester, UK; Brian McMahon, IUCr.