23rd International Congress on X-ray Optics and Microanalysis (ICXOM23)
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In BNL, Upton, NY
ICXOM23 will bring together scientists in the fields of X-ray microanalysis and those involved in optical instrumentation developments which will extend the reach of microanalysis. Although synchrotron radiation will be at the heart of the conference, since electron microscopy offers a different view of materials, the conference also welcomes contributions of recent developments in that field.
Topics Include
- Optics for microanalysis
- Scanning microscopy
- Full-field imaging
- Coherent Imaging
- PEEM
- Electron microscopy
- Microdiffraction
- Data analysis
- Detectors
Contact:
Nancye Wright (BNL)