European Conference on X-Ray Spectrometry EXRS2016

In Gothenburg

Interactions of X-rays with matter and fundamental parameters
XRS Instrumentation (X-ray sources, optics and detectors)
Quantification methodology and metrology
TXRF, GIXRF and related techniques
Microbeam techniques, confocal XRF and X-Ray imaging
Mobile and portable XRF
Synchrotron XRS, XAFS, high resolution XES, and RIXS
PIXE instrumentation and applications
Electron induced XRS
WDXRS
X-ray diffraction (XRD)
XRS in Art and Cultural Heritage
XRS in Advanced Materials and Nanoscience
XRS in Earth and Environment sciences
XRS in Industrial Quality and Process Control
XRS in Life Sciences and Forensics
Recent Scientific Developments by XRS Instrumentation Manufacturers (reserved to exhibitors)

Contact:

Johan Boman