Fundamentals of X-ray Powder Diffraction

ICDD X-ray Diffraction Clinics

Session I

• Production and properties of X-rays: continuous and characteristic radiation, absorption, scatter and diffraction
• Production of monochromatic X-radiation: choice of source conditions, use of beta-filters, proportional detectors and pulse height selection, monochromators, use of the Si(Li) and Ge(Li) detectors
• Components of the diffraction pattern: expected reflections, Miller indices, unexpected reflections, effect of scatter and fluorescence, factors affecting peak positions and intensities
• The powder diffractometer: optical arrangement, factors affecting instrumental profile widths; choice and function of divergence slits, calibration and alignment, detectors, X-ray optics
• Acquisition of good diffraction data: specimen requirements, preparation techniques, use of standards, and proper operation of powder diffractometers
• Qualitative phase identification: the Powder Diffraction File™, quality of reference patterns, the Alphabetical, Hanawalt, and Fink Indexes, automated methods, and specialized subfiles
• Industrial applications of X-ray powder diffraction
• Hands-on use of personal computers for demonstration of the latest software
• Data mining with the PDF