Objective Analysis of Systematic Errors in Single-Crystal Diffraction Data

At 14:00 CET (Central European Time), 13.00 GMT. The workshop is also repeated on 23rd April 2026 at the same time.

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Workshop Content

• Fundamentals of detection of systematic errors in X-ray, neutron, and electron diffraction

• Residual analysis as a tool for identifying systematic effects

• Quantitative evaluation of reproducibility

• Cross-comparison of datasets (instrument, site, or generation comparisons)

• Interpretation of characteristic error patterns

• Derivation of concrete optimization strategies

Target Audience

• R&D and development leaders

• Application scientists

• Quality management and methodology specialists

• Scientific group leaders

• Technical sales and product managers in instrumentation