Skip to main content

National Workshop on Recent Trends in X-Ray Diffraction Techniques (RTX-2014)

| - |

In Chennai, Tamil Nadu

Characterisation of materials Computing Data analysis General High pressure Materials Powder diffraction Synchrotron radiation

As a part of the commemoration of the International Year of Crystallography, the Centre for Nanoscience and Nanotechnology (CNSNT), Sathyabama University, is conducting this workshop.

Topics to be covered

  • Crystallography and powder diffraction
  • Characterization of nanomaterials using XRD
  • Thin films (polycrystalline and epitaxial) and their characterization using XRD
  • High temperature and high pressure XRS in materials science and metallurgy
  • Applications of X-ray synchrotron radiation
  • Grazing incidence X-ray reflectivity (XRR)
  • Small molecule crystal structures
  • Recent advancements in XRD
  • XRD software for data analysis
Contact:
Dr T. Sasipraba (Convener)
Image
event id 104021 image ID 104022