16th XTOP Biennial Conference on High-Resolution X-Ray Diffraction and Imaging
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In Karlsruhe
The first XTOP conference was held in Marseille in 1992. With an initial focus on X-ray topography andhigh-resolution X-ray diffraction, the conference has always combined aspects of X-ray scattering and X-ray imaging. Over time, other related topics such as X-ray phase-contrast imaging, tomography and microscopy, and various scanning X-ray imaging techniques have been added.
Today, XTOP brings together scientists working on X-ray diffraction, reflection, grazing-incidence scattering, standing-waves, coherent diffraction, and ptychography techniques, as well as X-ray microtomography, microscopy and other imaging techniques based on phase, diffraction, scattering, or spectroscopic contrasts.
XTOP is a leading scientific conference on instrumentation, methods, and applications of laboratory and synchrotron-based X-ray diffraction and imaging techniques.
Important Dates
- Opening for the submission of abstracts: March 23, 2026
- Deadline for submission of abstracts: May 4, 2026
- Opening of the registration: beginning of April 2026
- Early bird registration deadline: June 8, 2026
- Deadline for late registration: August 3, 202