The school aims to provide advanced training of neutron, X-ray, and light scattering experiments for young post-graduates and post-doctors in the field of soft matter science. A primary focus will be on the methodology of static and dynamic scattering techniques and provide information on data interpretation and recent applications and developments.

Registration for the school is now open, with a deadline of 21st February 2018.

https://indico.ill.fr/indico/event/86/page/5

The school is limited to 35 students. There is an estimated participation fee of 850 euros, which includes the cost of accommodation with full board and additional recreational activities.

The school provides neutron and muon beam research training for newcomers to the technique from a variety of backgrounds. In addition to lectures, the course provides practical sessions of hands-on experiments and data analysis. The school has a registration fee of JPY 30,000 - this fee includes a room charge and full board throughout the entirety of the school course. Financial support is available for participants travelling from developing countries.

For more information, and registration links, please visit:

http://www.cross-tokai.jp/9thAONSAschool/about.html

Registration deadline: 30th July 2017Â

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The school aims to contribute to the training of scientists in treatment of X-ray and neutron diffraction data. The lectures at the school will be dedicated to general applications (2 days) and analysis of different problems on condensed matter science (2.5 days).Â

The maximum number of participants is limited to 30 - candidates will be selected based on their motivation letter and CV (including a letter of recommendation from the thesis supervisor for applications from PhD students).

For more information and registration, please visit:

https://indico.ill.fr/indico/event/84/

Registration deadline: 8th September 2017

This workshop addresses crystallographers in the field of structural biology
who want to expand their field of possibilities to electron crystallography.
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The list of speakers encompasses experts in sample preparation, electron
microscopy hardware, electron detectors, and methods from data processing via
structure solution to model building. They will present recent results from
the field of electron crystallography.
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Participants will have the possibility of vivid discussions and get answers
for their open questions in a very young field.

Tutorials include data processing with DIALS and XDS, as well as Molecular
Replacement and Refinement at the characteristics of electron diffraction
data.

This school will focus on the basics of of crystalline structure determination, by use of X-ray diffraction, and on the relevant refinement and analysis methods used in such determination.

The primary languages of the school are both English and French.

Registration deadline: 10th June 2017.

For more information and registration, visit:

http://crm2.univ-lorraine.fr/lab/fr/education/congres/nancy2017/informations-generales/

Topics

• Recent advances in genomics, proteomics, and metabolomics
• Integrating different 'omics data
• Post-translational modification: expanding proteome diversity
• Novel 'omics technologies - including 'omics and structural biology
• Clinical applications of multi-omics

This is the third and final Workshop organised by the Diffraction Data Deposition Working Group (DDDWG), appointed by the IUCr Executive Committee to define the need for and practicalities of routine deposition of primary experimental data in X-ray diffraction and related experiments. It will take the form of a full-day workshop at the 2017 American Crystallographic Association Meeting with lectures from crystallographic practitioners, data management specialists and standards maintainers.

Objective: This workshop has two plenary sessions:

• What every experimentalist needs to know about recording essential metadata of primary (raw) diffraction data
  This will include: sample preparation and characterization; correct recording of instrument axes, correction factors, calibration - instrument manufacturers; attention to diffuse scattering or other interesting "metadata".
• Research Data Management policy mandates and requirements on Principal Investigators (PIs)
  This will include metadata standardization; data repositories; primary data linking to publications.

There will also be an optional technical session:

• High-data-rate/high-performance-computing issues of research data management for MX
  For synchrotron- and XFEL-based macromolecular crystallography (MX), high source brightness and the new generation of pixel array detectors raise big-data, high-performance-computing and high-performance-networking issues in research data management. There will be an optional early evening sub-session of the Research Data Management workshop to discuss the high-data-rate/high-performance-computing issues of research data management for MX that will include discussion of appropriate hardware choices and programming techniques that are useful in this context. All registrants for the Research Data Management workshop are welcome to attend this workshop sub-session.

Location: Hyatt Regency Hotel, New Orleans, LA, USA
Time: 08:30-18:15

The workshop will be held for the first time at the Institute of Condensed Matter Chemistry of Bordeaux (ICMCB), and is organized by the CNRS network under the aegis of the French Association of Crystallography and the German Society of Crystal Growth. Â The workshop will bring together scientists and scholars from industry, research labs, and universities to present and discuss the recent advances in the field of oxide crystals, dielectric materials, laser and non-linear optical crystals, solid-state lasers, and related topics.

Attendants are encouraged to provide an oral presentation or a poster at the workshop.Â

The deadline for abstract notification: 2nd June 2017

The deadline for registration: 25th August 2017Â

This three-day workshop follows the symposium (6-7th March) and is dedicated to demonstrations and practical training sessions in correlative microscopy techniques. Correlative microscopy workflows to be demonstrated include cryo-TEM, cryo-X-ray microscopy, cryo-fluorescence and super-resolution microscopy, and sample marking using multiphoton techniques. The final day of the workshop will be dedicated to data analysis techniques

This two-day workshop will focus on software used for calculating the resolution function of triple axis spectrometers and comparing the data with models. The main software packages will be RESTRAX (http://neutron.ujf.cas.cz/restrax/) and TAKIN (http://www.sciencedirect.com/science/article/pii/S2352711016300152). This workshop is intended for users of triple axis instruments to provide support in evaluating their measurements. Furthermore, future developments for a better understanding of more complicated resolution approaches will be discussed.

The workshop will take place at the MLZ in Garching.

There are no workshop fees and lunch and coffee will be served. The participants have to cover the costs for accommodation and travel.

For registration and the detailed program please use the following link: https://webapps.frm2.tum.de/indico/e/tripres

There are only places available for 20 participants - registration closes on 28th February 2017.

The Diamond Light Source Macromolecular Crystallography group would like to invite both our academic and industrial users to MX beamline training sessions on the 22nd and 23rd February 2017.

The aim is to provide MX users with sufficient training to be able to operate any of the Diamond MX beamlines efficiently and to get the most benefit from their beamtime. The training will involve hands-on sessions on the suite of five operational MX beamlines (http://www.diamond.ac.uk/mx-home/) as well as optional offline software sessions.

 Sessions include:
22nd February afternoon optional session hands-on software:

Tutorial sessions:

• Â CCP4i2: scaling with Aimless, phasing and refinement (CCP4 team)
• Â Data processing with DIALS and Mosflm

23rd February session on MX beamlines:

• Multi-axis goniometry / Anomalous data collection
• Sample humidity control (HC1)
• I24 new end station/ In-situ diffraction
• Experiment database:Â ISPyB
• MX pipeline / autoprocessing

Registration is free-of-charge with lunch provided on the 22nd and 23rd February, and accommodation and dinner for the night of the 22nd February. Travelling expenses within the UK will also be provided. The training is targeted at all users, and is not limited to students and post docs. It is essential that each BAG sends at least one representative per calendar year.

Registration
Places are limited to twenty five participants. The registration deadline is on the 8th February.

Taking advantage of the facilities at the European Synchrotron Radiation Facility and Institut Laue Langevin, this one week theoretical and practical course will cover both basics and applications of small-angle X-ray scattering and small-angle neutron scattering on biomacromolecular solutions.

More information, including the application requirements, can be found at: http://meetings.embo.org/event/17-small-angle-scattering

Application deadline is 15th June 2017.

Conference OP316

X-ray Nanoimaging: Instruments and Methods III

Important Dates

• Abstract Due: 23 January 2017
• Author Notification: 3 April 2017
• Manuscript Due Date: 10 July 2017

Conference Committee

Conference Chairs

• Barry Lai, Argonne National Lab. (United States)
• Andrea Somogyi, Synchrotron SOLEIL (France)

Program Committee

• Yong S. Chu, Brookhaven National Lab. (United States)
• Michael Feser, Lyncean Technologies, Inc. (United States)
• Hans M. Hertz, Royal Institute of Technology (Sweden)
• Ian McNulty, Argonne National Lab. (United States)
• David Paterson, Australian Synchrotron (Australia)
• Christian G. Schroer, DESY, Univ. of Hamburg (Germany)
• Kazuto Yamauchi, Osaka Univ. (Japan)

Call for Papers

In recent years, both synchrotron and laboratory-based facilities have witnessed astounding progress in hard x-ray nanoimaging instruments and methods. Nanoprobes with sub-100-nm resolution have proliferated, while imaging with 1-nm spatial resolution may soon become possible. Combination and correlation with other analytical techniques such as x-ray spectroscopy, diffraction, tomography, ptychography, in-situ environment, and other methods are solving more important questions than ever.Â

This conference will focus on the latest developments in optics, instrumentation and systems, data science, and integration with other techniques, for both scanning and full-field x-ray microscopes, including:

• nanoprobes, full-field microscopes, and dedicated beamlines
• high-resolution nanofocusing optics
• instruments for nanoimaging and nanopositioning
• in-situ and operando sample environments
• data science and data management
• novel nanoimaging methods and correlative techniques
• advanced control or detection schemes.

This conference has an open call for papers:

• SUBMIT AN ABSTRACTÂ (SIGN IN REQUIRED)
• Submission guidelines for Authors and Presenters

International Collaboration on Advanced Neutron Sources (ICANS XXII) Â

The 22nd meeting of the International Collaboration on Advanced Neutron Sources (ICANS XXII) will be held on the 27th -31st March 2017 in Oxford, England.

For more details, visit: Â http://icansxxii.iopconfs.org/home

 The abstract submission deadline is 30 November 2016.  ICANS is an informal network of laboratories whose scientists and engineers are involved in developing pulsed neutron sources and accelerator based spallation neutron sources.  The collaboration was founded in 1977 as a forum to promote discussions and collaborative work, and to share information on three main topics: accelerators, targets and moderators, and instruments.  After 24 years, the meeting returns to the UK and will be hosted by the ISIS Neutron and Muon Source at the Said Business School, University of Oxford with accommodation at St Anne’s College.  In addition to the core areas of accelerators, target and instrumentation, other key areas such as sample environment, data analysis and computing, polarisation, detectors, shielding and neutronics will be discussed.  It is the principal goal of ICANS to promote and facilitate informal discussions and, as such, the meeting will comprise several workshop sessions.   Key dates: Abstract submission deadline: 30 November 2016 Early registration deadline: 31 January 2017 Registration deadline: 17 March 2017 Paper submission deadline: 27 March 2017

This workshop will provide an overview of the methods of structural analysis of incommensurately modulated crystals and composite crystals.Â

Lectures will cover the basic principles of the superspace approach as well as recent developments on modulation functions and structure solution.Â

Participants will have the opportunity to practice structural analysis in superspace with the computer programs Superflip and JANA2006.Â

A step-by-step tutorial will guide you through structure determination, symmetry analysis, structure refinement and t-plots for crystal-chemical analysis of selected examples of modulated structures and composite crystals.

Organisation: German Association for Crystallography (DGK)Â

Local Organisation: Sander van Smaalen and Andreas Schönleber. Email: [email protected]

A workshop attached to the 2016 HZB Users Meeting.

In the workshop we will deal with various aspects of modern approaches to processing macromolecular diffraction data. Automated decision-making in the process will be discussed as well as pathologies in diffraction data.

Registration is free of charge but participation is limited to 50. Acceptance will be on first-come first-serve bases.

Registration includes workshop participation, lunch and coffee breaks only.