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IUCr 2014 XAFS Tutorial

for crystallographers and beginners, Montreal, August 5, 2014

A one-­day, free Tutorial Workshop on XAFS titled "IUCr 2014 XAFS Tutorial for crystallographers and beginners" was held on August 5, 2014, in Montreal as a satellite event for the XXIII International Congress and General Assembly of the International Union of Crystallography (IUCr2014, Montreal, August 6-­14, 2014, http://www.iucr2014.org). This workshop was organized by the IUCr XAFS Commission and the International X‐ray Absorption Society.

W1 X-Ray Absorption Spectroscopy for the Crystallographer

Hyderabad, 21 August 2017

Venue: MR. 1.01

 

A one-­day, free Workshop on XAFS titled "X-Ray Absorption Spectroscopy for the Crystallographer" was held on August 21, 2017, in Hyderabad as a satellite event for the XXIV International Congress and General Assembly of the International Union of Crystallography (IUCr2017, Hyderabad, August 12-28, 2014, http://www.iucr2017.org).

IUCr 2023 and related events

IUCr 2023 Keynote and MS

The CXAFS organized a keynote lecture and six microsymposia at the IUCr Congress in Melbourne in 2023. 

Keynote lecture

Dr Daniel Bowron, from the ISIS Neutron and Muon Source, gave a keynote talk titled ‘Exploring Chemical Function in Structurally Disordered Systems through Atomistic Modelling of Diffraction and Spectroscopy Data’. The talk was very well attended, attracting interest from other commissions. 

XAFS-related entries in the online dictionary of crystallography

More than 12 000 papers concerning X-ray absorption techniques have been published over the last five years and the XAFS Commission's (CXAFS) contribution to the IUCr Dictionary has been considered a priority. One important objective of this endeavor was to identify ambiguous or incorrect usage of XAFS expressions in the scientific language. Our objective was not to formulate "perfect" definitions, but to propose currently used definitions that could eventually be improved through an open debate.

Acronyms

Compendium of XAFS beamlines

  • BioXAS: XAS applied to biomolecules
  • DAFS: Diffraction Anomalous Fine Structure
  • EXAFS: Extended X-ray Absorption Fine Structure
  • GIXAFS or GIXAS: Grazing incidence XAFS or XAS (related to RefleXAFS)
  • MicroXAS: XAS with high spatial resolution
  • MAD: Multiwavelength Anomalous Diffraction
  • NEXAFS: Near Edge X-ray Absorption Fine Structure (same as XANES, which is more commonly used for hard X-rays)
  • PES: PhotoEmission Spectroscopy
  • RefleXAFS (or ReflEXAFS): Reflection XAFS (related to GIXAFS)

Activities endorsed by the Commission

IUCr CSC Sponsored Meetings, Schools and Symposia 2009 - 2011

  • 2nd International School of Crystallisation: Drugs, Foods, Agrochemicals, Minerals, New materials, Granada, Spain>, May 24-28, 2010
  • Gordon Conference in Crystal Engineering Waterville Valley Resort, Waterville Valley, NH, USA, June 6-11, 2010
  • American Crystallographic Association Meeting, Chicago, IL, USA, July 24-29, 2010
  • 2nd Canadian Chemical Crystallography Workshop McMaster Analytical X-ray (MAX) Diffraction Facility, McMaster University, Hamilton, Ontario, Canada, May 25- 29, 2010

History of the IUCr Commission on Structural Chemistry

Establishment of a Commission on "Small Molecules"

After the IUCr Congress in Ottawa in 1981 there were grumblings within the small molecule community that "disproportionately few oral sessions were devoted to small molecule structural analysis and those were relegated to the last days of the meeting when protein crystallographers had departed and most attendees were exhausted".

Terms of Reference

Approved by action of the IUCr General Assembly, 14 August 1996

In the following, by "small-angle scattering" (SAS) we mean any experimental technique that seeks to probe the microstructure of materials, including both synthetic and biological materials, on distance scales ranging between 1 and 10,000 nanometers. Examples of such methods currently in use include: small-angle x-ray scattering, small-angle neutron scattering, light scattering, x-ray reflectometry, and neutron reflectometry.

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