L'Institut de Chimie Séparative de Marcoule et l'Institut Européen des Membranes organisent une Ecole de Réflectivité des rayons-X et des neutrons à Marcoule du 1er au 3 octobre 2014.

Le programme met l'accent sur la pratique : manipulation à l'appareil et modélisation des données. Des cours théoriques complètent la formation.

Cette école s’adresse surtout à des doctorants et des jeunes chercheurs travaillant dans le domaine des surfaces et des couches minces et souhaitant utiliser la réflectivité.

The 2014 summer school will focus on providing theory and practical experience for researchers interested in improving their imaging capabilities. This school will provide background theory and practical experience from proposal writing to sample prep through data collection, reconstruction and visualization. We invite scientists who have some experience with synchrotron based imaging to apply. Participation is limited at 20 to ensure everyone is able to gain hands-on experience. Sessions will include:

• An insider’s view of the CLS peer review process with hints and tips on writing a killer proposal
• Sample preparation â€" what to consider prior to beamtime
• Computed Tomography â€" reconstruction and visualization
• Diffraction Enhanced Imaging
• K-edge Subtraction Imaging
• Phase Contrast Image Retrieval
• Introduction to and practical experience with various software packages
• Full day workshop using Paraview, a visualization software package
• Introduction to other CLS techniques and beamlines that may be useful
• Ample opportunity for socializing and networkingÂ

Confirmed speakers: L. Dean Chapman, Canada Research Chair in X-ray Imaging and Nuclear Initiative Special Advisor and Professor, Anatomy & Cell Biology, College of Medicine, University of Saskatchewan;Â David Cooper, Canada Research Chair in Synchrotron Bone Imaging and Assistant Professor, Anatomy and Cell Biology, College of Medicine, University of Saskatchewan; Tomasz Wysokinski, CLS Staff Scientist, BMIT; George Belev, CLS Staff Scientist, BMIT.

• Workshop 1: High-Resolution RIXS and NanoARPES
• Workshop II: Coherent X-ray Scattering
• Workshop III: Applications of Synchrotron Radiation to Structural Biology
• Workshop IV X-ray Nano-analysis on Condensed Matter Physics and Materials Science

International Workshop on Phase Retrieval and Coherent Scattering

The International Workshop on Phase Retrieval and Coherent Scattering is a (mostly) biennial meeting series devoted to coherent X-ray physics. Four topics in particular will be covered:

• Imaging with coherent X-rays and electrons
• Structure and dynamics via photon correlation
• Opportunities with new sources
• Theoretical and computational methods

Previous conferences in the series have been at Lawrence Berkeley Lab, USA, May 2001; Palm Cove, Australia, June 2003; Porquerolles, France, June 2005; Asilomar, California, USA, June 2007; Warnemünde, Germany, June 2010; and Fukuoka, Japan, June 2012. In keeping with the tradition of waterside locations for most of these meetings, the conference will be held at Norris Center on the campus of Northwestern University in Evanston, Illinois, on the shore of Lake Michigan.

Invited Speakers

• Henry Chapman (keynote)
• Christian Schroer
• Stephan Hruszkewycz
• Yukio Takahashi
• Felisa Berenguer
• Mark Sutton (keynote)
• Jesse Clark
• Sujoy Roy
• Beatrice Ruta
• Massimo Altarelli
• Christoph Quitmann
• Gabriella Carini

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The premier conference for the latest developments in optical design and engineering, as well as space optical systems, X-ray / EUV optics, information processing, photonic devices, remote sensing, and astronomical instrumentation.

• NanoScience + Engineering
• Solar Energy + Technology
• Organic Photonics + Electronics
• Optical Engineering + Applications
• SPIE Optical Engineering + Applications

The 2014 Kuo Symposium on 3D Cryo-EM Molecular Imaging to be held July 28 - 30, 2014, in Shanghai, China. There will be a two-day workshop: The 7th K. H. Kuo Summer School of Electron Microscopy & Crystallography (July 26 - 27) immediately before the symposium. The symposium is partially sponsored by the K.H. Kuo Education Fund and the Chinese Academy of Sciences. The scientific program is being arranged by an organizing committee that includes Huilin Li (SUNY Stony Brook, USA), Yifan Cheng (UCSF, USA), Yao Cong (SIBCB, China) and Yongning He (SIBCB, China).

As a background, the annual EM meeting series is named after the late Prof K.H. Kuo, a prominent electron microscopist who discovered quasi-crystals and first introduced cryo-EM to China, who also trained a generation of electron microscopists in China, including some of us organizing this symposium/summer school. The Kuo Education Fund was established by his over 100 former graduate students as a tribute to Kuo as a great scientist and a loving mentor. The subject of the school series alternates between biology and material science. The cryoEM meeting has evolved from a summer school aimed to bring modern cryoEM technology to Chinese students into an important international symposium in the field of cryoEM in Asia. It has witnessed rapid growth of cryoEM community in China as well as other Asia countries. The last (3rd) biological cryo-EM meeting was held in Huangshan (Yellow Mountain) in September 2012 and was chaired by Hong Zhou ( http://cryoem.csp.escience.cn/dct/page/1) and attended by students from mainland China, Taiwan, Korea, Singapore and Europe.

Scope

The joint conference will cover a wide range of topics related to functional imaging of nanomaterials by various techniques including Scanning Probe Microscopy (Piezoresponse Force Microscopy â€" PFM, Electrochemical Strain Microscopy â€" ESM, Kelvin Probe Microscopy â€" KPM), Scanning Electron Microscopy (SEM), Optical Microscopy (Confocal Microscopy â€" CM, Scanning Near-Field Optical Microscopy â€" SNOM, and Raman Microscopy â€" RM). The Youth Conference will consist of an extensive tutorial and scientific conference on nanoscale phenomena in ferroelectrics, ionic conductors, and polar biomaterials.

PFM-2014 main topics

• Instrumental aspects of PFM, ESM, KPM, SNOM, and related techniques as applied to functional nanomaterials
• Ferroelectrics, piezoelectrics, and ionic conductors on the nanoscale
• Multiferroic phenomena and magnetoelectric coupling on the nanoscale
• Disordered ferroelectrics, domains, and mesoscopic effects
• Ferroelectric data storage and polarization lithography
• Ferroelectric photovoltaics and tip-enhanced phenomena
• Interface and domain engineering
• Biocompatible & organic polar materials on the nanoscale
• 1D and 2D nanostructured materials
• Theory and modeling

Identification of crystalline materials with the polarized light microscope is of importance for those working in forensics, soil science, pharmaceuticals, environmental analyses, analysis of pigments, and earth sciences. This class introduces the student to a range of methods used for the identification of crystalline materials. A number of techniques are employed or demonstrated, including immersion methods, crystal rotation methods and the use of rotating compensators. Optical properties of both isotropic and anisotropic comminuted mineral samples are used as examples throughout the course.

Course Outline:

This is an advanced course in X-ray microanalysis using energy-dispersive x-ray spectrometry (EDS). The prerequisite is successful completion of INS-510: Scanning Electron Microscopy or an equivalent level of experience. The course will provide instruction and hands-on practice on performing EDS, analyzing difficult samples, mapping, and interpreting analysis results.

Course outline

• Brief review of the theory of X-ray generation
• Optimizing X-ray detection
• Qualitative X-ray strategies for difficult samples
• Performing matrix correction and quantitative analysis
• Elemental line profiling and spectral imaging
• Interpreting EDS data

2014 SMB Imaging Summer School

The 1st SSRL SXRMI (Synchrotron X-ray MicroXAS Imaging) School will provide a practical users' guide to planning and conducting microXAS imaging experiments at SSRL beam lines. Students will participate in hands-on sessions at the beam lines, including on the following facilities: hard x-ray microXAS imaging (BL2-3), hard X-ray mesoprobe XAS imaging (BL10-2), and the newest microXAS imaging "tender" energy beam line (BL14-3). The hands-on sessions will be paired with several sessions of data analysis and data mining of imaging data. The School will also cover new instrumentation and techniques at SSRL microXAS imaging beam lines and will include topics that can only be learned by direct access and experience at the facility through on-the-experiment training.

This school will provide a practical users' guide to planning and conducting microscale imaging and spectroscopy measurements at SSRL beam lines, and will cover important techniques including X-ray fluorescence imaging, microscale and mesoscale X-ray absorption spectroscopy, as well as hard and tender X-ray experimental ranges. The school will address topics that are not commonly included in text books or class lectures, and typically obtained only through on-the-experiment training. There will be:

• Introductory session to SSRL imaging beam lines
• Sessions of sample preparation tips, tricks and experimental planning
• Hands-on sessions at SSRL beam lines
• Sessions of data processing and analysis
• Sessions of spectroscopy theory

The school will also cover new instrumentation at SSRL imaging beam lines.

This school has been made possible with support from the DOE-BES.

Ultrafast Dynamics with X-Rays and Electrons

History and scope

The first XTOP conference ("X-ray Topography and High Resolution Diffraction") took place in Marseille in 1992. The original topics covered were topography, double- and triple-crystal diffractometry of epitaxial layers, reflectometry and standing waves technique, with other added at later meetings. Topics for XTOP '2014 hold to the traditions of all the previous conferences.

XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray phase contrast imaging (radiography and micro-tomography). XTOP is thus one of the central scientific conference concerning methods and instrumentation in synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.

Previous XTOP conferences:

• 1992: Marseille (France)
• 1994: Berlin (Germany)
• 1996: Erice (Italy)
• 1998: Durham (United Kingdom)
• 2000: Ustron-Jaszowiec (Poland)
• 2002: Aussois (France)
• 2004: Prague (Czech Republic)
• 2006: Baden-Baden (Germany)
• 2008: Linz (Austria)
• 2010: Warwick (United Kingdom)
• 2012: St Petersburg (Russia)