This two day workshop will serve as an introduction to the pair distribution function (PDF) method, a technique for determining the local structure in disordered materials. We will cover the basic theory of the method, data processing, and an in-depth tutorial on structure refinement implemented in TOPAS v.6. Please note that the website may not yet be available.

Powder diffraction: Theory, Software and Applications

The aim of the 2018 edition of the Italian Crystallographic Association (AIC) International Crystallography School (AICS2018) is to give an overview on the characterization of polycrystalline materials through X-ray Powder Diffraction. The topics of the school span from the fundamental principles of powder diffraction to advanced methods of data collection and analysis with examples of applications of scientific and industrial interests. For each topic, theory will be strictly followed by practical sessions centred on the relevant software so that participants familiarise with some widely used computer programs for data analysis and interpretation of the results.

A number of bursaries and grants are available to aid the participation of young researchers in attending the school. Please visit the conference website and complete the necessary application forms to apply for bursaries and register for the school.

Bursary application deadline: 20th May 2018

Registration deadline: 15th June 2018

The school will be co-located at Diamond and Jesus College, Oxford, with participants staying in Oxford.

The SR School provides postgraduate students and post-doctoral researchers, who have little experience of Synchrotron Radiation (SR), a broad-based introduction to many of the different types of experiments conducted using SR. It is largely aimed at physical scientists, but life scientists are welcome to apply. The school gives the attendees the opportunity to obtain hands-on practical experience of performing an experiment on several of the Diamond beamlines. At least 14 Diamond beamlines will be particpating in the school (see below for details).

 Topics covered in the course lectures

• X-ray Scattering
• Symmetry and Crystallography
• The Diamond Synchrotron
• X-ray optics and detectors
• An introduction to the data analysis program DAWN

And the synchrotron use of:

• Infrared Microspectroscopy
• Powder Diffraction
• Resonant and Magnetic Scattering
• Small-Angle Scattering
• Surface Diffraction
• X-ray Absorption Spectroscopy
• X-ray Imaging
• X-ray Photoelectron Spectrocopy

The fourth “Modern Methods in Rietveld Refinement for Structural Analysis” will be held at the Advanced Photon Source of Argonne National Laboratory in close partnership with Bruker-AXS, ANL, and the National Science Foundation. Â

The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique - an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using MAUD software.

For more information about the workshop, please contact us:

Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France: scientific coordinator, [email protected]

Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand: organization coordinator, [email protected]

Participation is open for anyone, TOPAS users and non-users, interested in learning more about TOPAS capabilities and applications.Â

Topics to be covered will include:

• Data collection strategies for X-ray and neutron diffraction
• Constant-wavelength and time-of-flight diffraction
• Modelling peak shapes (including microstructure analysis)
• Indexing powder patterns
• Rietveld, Le Bail and Pawley fitting methods
• X-ray and neutron combined Rietveld refinements
• Restrained refinements
• Rigid body refinements
• A number of more specialised and advanced optional topics (ab initio structure solution, parametric and symmetry-mode refinements)

You are cordially invited to participate to the 6th TUNISIAN CRYSTALLOGRAPHIC MEETING (TCM6) by submitting a paper and actively assisting in its work.

TCM6 is intended to provide an excellent opportunity for National, Maghreb and International researchers to make their own work known to a wider audience and to have discussions with other participants. This conference will also be an opportunity to exchange experiences, create and consolidate cooperation between different research structures.

This outstanding conference, organized by the “Tunisian Crystallographic Association”, will take place from 1â€"5 November 2017 in a beautiful and exotic Hotel: El Mouradi Djerba Menzel 4* on Djerba Island, an ecological place, very popular by its palm groves, its beaches and its wetlands populated by various species of migratory birds.

The conference will expand to cover a broad set of research topics about:

• Crystal Structure of Materials, Nanoparticles and Minerals
• Chemical Crystallography
• Cements
• Thin films
• Magnetic order and its consequences
• Dielectrics and multiferroics
• Crystal structure relationships and their applications
• Semiconductor devices and their applications

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Important Dates :

Abstract submission deadline: September 15, 2017

Acceptance notification:Â October 1, 2017

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More information is available on the conference web site: http://tcm6.org/

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Abstracts for consideration as oral and poster presentations can be submitted online via:

·         The conference’s official website:http://tcm6.org/

·         Email: [email protected]

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Please feel free to forward this invitation to any of your colleagues who may be interested.

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We are really looking forward to welcoming you in DJERBA.Â

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Topics will include:

• Qualitative Phase Analysis with XRPD
• Quantitative Phase Analysis: Single-peak, Whole-Pattern Methods and Beyond
• Amorphous, Mesomorphous and Nano Materials
• Non-Ambient Powder X-ray Diffraction
• New Developments/Complementary Techniques
• Formulation and Product Development
• Polymorph, Salt and Co-crystal Screening
• Crystal Structure Prediction, Elucidation and Verification from Powder Diffraction Data