Meeting report (IUCr supported)
15th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP 2024)
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The 15th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP 2024) was held in Carry-le-Rouet, France, from 17 to 22 March 2024.
The first XTOP conference took place in Marseille, France, in 1992 and the last in Bari, Italy, in 2018. The main scope of the conference was set in 1992 to X-ray topography and high-resolution diffraction. However, over time the conference has covered other related topics such as X-ray tomography, phase sensitive scattering, scanning techniques etc. Nearly a third of the 150 participants at XTOP 2024, who came from 18 different countries, were young scientists.
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Tutorials
The first day (18 March) was devoted to a companion school with five tutorial lectures, aimed at (but not exclusively for) students:
- Basic concepts of X-ray scattering and prospects - Ian Robinson, London Centre for Nanotechnology, UK
- X-ray surface scattering and its applications - Frank Schreiber, Eberhard Karls Universität Tübingen, Germany
- Laue Diffraction X-Ray Microscopy - Jean-Sebastien Micha, Université Grenoble Alpes, UMR SyMMES, CNRS-CEA/IRIG, European Synchrotron Radiation Facility (ESRF), Grenoble, France
- Bragg coherent diffraction imaging and its applications - Marie-Ingrid Richard, CEA Grenoble, France
- X-ray ptychography microscopy and its applications - Virginie Chamard, Institut Fresnel, Marseille, France.
XTOP conference
The second day (19 March) saw the opening of the XTOP conference and ended with a lecture in honour of Professor André Authier, a specialist in X-ray topography, given by Michèle Sauvage, Emeritus Senior Scientist at SOLEIL, France. The sessions continued for the next three days, interspersed with a half-day boat excursion; an evening lecture on the history of the XTOP conference by José Baruchel, Emeritus Scientist at ESRF, France; and the gala dinner.
![[Fig. 1]](https://www.iucr.org/__data/assets/image/0003/159033/Fig.1.png)
Poster sessions.
IUCr Young and Early Career Scientist Awards
The selection committee received 14 excellent applications from young researchers and PhD students, and decided to award four bursaries as follows (in alphabetical order):
- Fabian Gasser, PhD student, Graz University of Technology, Austria
Poster contribution: "Intensity Corrections for Grazing Incidence X-ray Diffraction" - Merve Pinar Kabukcuoglu, postdoctoral research fellow, Karlsruhe Institute of Technology, Germany
Oral contribution: "Correlated 2D and 3D X-ray Diffraction Imaging revealing the Evolution of Dislocations during Thermal Processing of GaAs wafers" - Maya Wehbe, PhD student, Université Grenoble Alpes and Commission of Alternative Energies and Atomic Energy (CEA), Grenoble, France
Oral contribution: "Combining dark-field X-ray microscopy with scanning X-ray diffraction microscopy to study GaN coalescence" - Jiangtao Zhao, postdoctoral research fellow, ESRF, Grenoble, France
Oral contribution: "Bragg coherent modulation imaging".
![[Fig. 3]](https://www.iucr.org/__data/assets/image/0005/159035/Fig.-3.png)
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