19th European Crystallography Meeting

Teaching Crystallography. B. Oleksyn, A. M. Glazer, U. Kolb, A. Hunter, M. Jaskolski, R. Neder.

Teaching Crystallography. M. Jaskolski, A. Hunter, A. M. Glazer, R. Neder, B. J. Oleksyn, U. Kolb.

Ferro-electricity and NLO materials. V. L. Jennings, P. A. Thomas, ?, E. Kroumova, ?, ?, S. Odunov.

Ferro-electricity and NLO materials. Vincent Jennings, ?, Pamela Thomas, ?, Eli Kroumova, ?, Sergiy Odulov.

Microporous Materials. ?, ?, ?, ?, ?, D. Viterbo, ?.

Twinning symmetry and related physical properties. V. Kopskÿ, M. Nespolo, H. Klapper, V. Shekhtman, E. P. Kharitonova, G. Heger.

Twinning symmetry and related physical properties. V. Kopskÿ, M. Nespolo, G. Heger, E. P. Kharitonova, H. Klapper, V. Shekhtman.

Structural properties of low-dimensional systems. ?, ?, ?, ?, S. van Smaalen, ?.

Industry and crystallography. ?, A. Pyzalla, ? ?.

Low-dimensional carbon-based material structure-property relationships, potential use.

Low-dimensional carbon-based material structure-property relationships, potential use. B. Sundqvist, ?, R. Moret, ?, ?, ?, C. Hérold.

Surface crystallography structure. ?, ?, R. K. Feidenhans'l.

Non-graphitic lamellar compounds: industrial applications, potential use.

State of the art of structure analysis using powder diffraction data. Lynne McCusker (right). Chair: D. Louër (left).

Ab initio prediction of crystal structures. Bouke P. van Eijck (left). Chair: F. H. Allen (right).

From Guinier's pioneering work to the study of charge density waves in low-dimensional conductors. Jean-Paul Pouget, Tadeusz Luty.

The probabilistic theory of the structure invariants assuming a substructure to be known. Herbert A. Hauptman (left). Chair: C. Giacovazzo (right).

X-ray diffraction, an efficient tool for industry: the case of cosmetic reseach. Jean-Luc Lévêque (right).

Femtosecond imaging of biomolecules by X-rays. Janos Hajdu (right). Chair: K. Wilson (left).

Powder diffraction SIG: Advanced methods for structure determination from powder data. J. Giovannini, D. Louër, A. Altomare, B. Kariuki, K. D. M. Harris, ?, ?.

Powder diffraction SIG: Advanced methods for structure determination from powder data. D. Louër, A. Altomare, B. Kariuki, J. Giovannini, K. D. M. Harris, ?, ?.

Powder diffraction SIG: Microstructure analysis by powder diffraction. A. Njah, D. Louër, ?, A. M. Tonejc, P. Klimanek, R. Kuzel.

Powder diffraction SIG: Microstructure analysis by powder diffraction. ?, A. Njah, R. Kuzel, A. M. Tonejc, D. Louër, P. Klimanek.

Mineralogical crystallography SIG: Mineralogical crystallography. ?, R. X. Fischer.

Mineralogical crystallography SIG: Mineralogical crystallography.

Mineralogical crystallography SIG: Theoretical studies of mineral structures and properties. S. Parker, M. Catti, P. Blaha, B. B. Karki, A. Oganov.

Aperiodic and incommensurate systems SIG. S. I. Ben-Abraham G. Chapuis, V. Petříček, ?, ?, D. Grebille.

Charge, spin and momentum densities SIG: New developments. Finn Larsen, ?, Birger Dittrich, M. A. Spackman, Anatoliy Volkov, Carlo Gatti.

Crystallographic Computing SIG: Hot and special topics in computational crystallography. M. Bolte, R. Herbst-Irmer, E. Egert, D. Watkin.

Crystallographic Computing SIG: Hot and special topics in computational crystallography. Carmelo Giacovazzo, Ernst Egert, Regine Herbst-Irmer, David Watkin, ?, Ton Spek.

Crystallographic Computing SIG: Refinement and modelling. Dusan Turk, S. Parsons, Anastassis Perrakis, Tom Oldfield, D. Watkin.

Crystallographic Computing SIG: Refinement and modelling. Dusan Turk, S. Parsons, Anastassis Perrakis, Tom Oldfield, D. Watkin.

Diffraction physics SIG.

Electron crystallography SIG: Electron crystallography in mineralogy and materials science. ?, S. A. Smirnova, J. Gjønnes, M. Mellini, A. Baronnet.

Electron crystallography SIG: Electron crystallography in mineralogy and materials science. ?, S. A. Smirnova, J. Gjønnes, M. Mellini, A. Baronnet.

Electron crystallography SIG: Nano-structured materials by diffraction, microscopy and microanalysis.

Electron crystallography SIG: Nano-structured materials by diffraction, microscopy and microanalysis.

Electron crystallography SIG: Electron crystallography of small molecules and organic materials. T. E. Weirich, ?, B. Lotz, ? U. Kolb, C. J. Gilmore.

M. Nespolo.

Extreme conditions SIG: new developments.

Extreme conditions SIG: Materials under extreme conditions.

Instrumentation SIG: Time-resolved diffraction studies in materials science. ?, H. Graafsma, G. Artioli, K. Ståhl, ?, Å Kvick.

Instrumentation SIG: Time-resolved diffraction studies in materials science. ?, H. Graafsma, G. Artioli, K. Ståhl, ?, Å Kvick.

Instrumentation SIG: Crystallography of grains and grain boundaries.

Instrumentation SIG: Telepresence/internet and remote experimental control. L. M. D. Cranswick, A. W. Hewat, R. Spagna, Th. Proffen, M. Ianigro, L. Lutterotti.

Instrumentation SIG: Telepresence/internet and remote experimental control. L. M. D. Cranswick, A. W. Hewat, R. Spagna, Th. Proffen, M. Ianigro, L. Lutterotti.

Instrumentation SIG: Instrumentation and techniques for crystallisation. Back row: J. Fontecilla-Camps, B. Byrne, S. Panjikar, G. DeTitta. Front row: A. Podjarny, A. Zagari, N. Chayen.

Instrumentation SIG: Instrumentation and techniques for crystallisation. Back row: J. Fontecilla-Camps, B. Byrne, G. DeTitta, S. Panjikar. Front row: A. Podjarny, A. Zagari, N. Chayen.

Instrumentation SIG: Experimental equipment in Africa. Seated at rear: A. Thalal, J. C. A. Boeyens.

Instrumentation SIG: Experimental equipment in Africa. J. C. A. Boeyens, A. Thalal, ?.

Instrumentation SIG: Experimental equipment in Africa. L. Aslanov, H. Schenk, ?, J. C. A. Boeyens, A. Thalal, ?.

Instrumentation SIG: Experimental equipment in Africa. L. Aslanov, J. R. Helliwell, H. Schenk, ?, ?, J. C. A. Boeyens, A. Thalal, ?.

Instrumentation SIG: Related topics - Neutron diffraction. A. Balagurov, F. Tasset, T. C. Hansen, J. Rodriguez-Carvajal, C. C. Wilson, ?.

Instrumentation SIG: Related topics - Neutron diffraction. A. Balagurov, F. Tasset, J. Rodriguez-Carvajal, C. C. Wilson, ?, T. C. Hansen.

Instrumentation SIG: Related topics - Crystallography of excited states. P. Coppens, H. Graafsma, P. Blaha, ?, R. Resta, ?, S. J. van Reeuwijk.

Instrumentation SIG: Related topics - Crystallography of excited states. P. Coppens, H. Graafsma, P. Blaha, ?, R. Resta, ?, S. J. van Reeuwijk.

Instrumentation SIG: Related topics - X-ray scattering and diffraction from non-crystalline biological systems.