Crystallographic resources


Entered: Thu Nov 04 2010

Operating systems: HPUX; Irix; Linux; Unix; MS Windows

Type: Binary

Languages: Fortran

Distribution: Free

Application fields: Diffraction

Bibliography: Prencipe, M. (1998) J. Appl. Cryst. 31, 109.

Description: Provides information about the quality of single- crystal data collections and helps in the determination of the space group to which the crystal belongs. Provides more realistic estimates for standard deviations of structure factors (especially in the case of high symmetry systems). It can be also used to create lists of hkl indices, to be submitted to a diffractometer for data collections on set of particular reflections. Upgraded version (27/06/01) available for PC and Unix machines (Linux included).


Last updated: 15 Oct 2021