SImPA
Entered: Thu Dec 09 2010
Operating systems: MS Windows
Type: Binary
Languages: C++
Distribution: Commercial
Application fields: Characterization; Diffraction; Graphics; Materials science; Minerals; Powder; Virtual reality; Visualization
Description: SImPA(Simplified Imaging Plate Analysis / version 1.3) provides the necessary tools to process a powder X-ray diffraction image recorded on a phosphor imaging plate for further analysis as follows: (1) Image display and manipulation, e.g. pixel intensity readout, image enhancement and enlargement; (2) Sample-to-plate distance calibration for the analysis of the X-ray diffraction image; (3) Imaging plate orientation correction; (4) Removal of spurious high intensity spots (e.g. Bragg spots from large single grains); (5) Azimuthal summation of pixel intensities for the construction of a high signal-to-background intensity profile as a function of the diffraction angle. SImPA offers an easy-to-use interface. A working version of SImPA (version 1.3) is available free of charge for evaluation. Contact Serge Desgreniers (sdesgren@uOttawa.ca) for further information.
References: http://www.ccp14.ac.uk/ccp/ccp14/ftp-mirror/xrda/pub/lpsd/simpa/manual/simpa_gu.htm