Crystallographic resources

SIMREF

Entered: Thu Dec 09 2010

Operating systems: Unix; MS Windows

Type: Binary

Languages: Fortran

Distribution: Free

Application fields: Chemistry; Diffraction; Materials science; Structure determination

Bibliography: Maichle, J. K., Ihringer, J. & Prandl, W. (1988). J. Appl. Cryst. 21, 22–28.

Description: Simultaneous Rietveld Refinement with Multible Powder Datasets.

References: http://www.soft-matter.uni-tuebingen.de/index.html?http://www.uni-tuebingen.de/uni/pki/simref/simref.html



Last updated: 15 Oct 2021