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Re: [dddwg] DDDWG: Standards for metadata
- To: IUCr Working Group on Diffraction data Deposition <dddwg@iucr.org>
- Subject: Re: [dddwg] DDDWG: Standards for metadata
- From: =?UTF-8?Q?Andreas_F=C3=B6rster?= <andreas.foerster@dectris.com>
- Date: Wed, 17 Feb 2016 13:10:25 +0100
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Dear Wladek and Tom,
thank you for assembling an initial list of metadata parameters. If I remember correctly, these are the data that all detector should record to allow for processing and archiving of the data. For this, I would include a few more fields:
- date of data collection
- place of data collection (synchrotron + beamline or home source)
- detector name, model and serial number
- possibly sensor material and sensor thickness for parallax correction
- X-ray flux
At some point, some checksum mechanism to ensure data integrity might be useful.
All best.
Andreas
On Tue, Feb 16, 2016 at 6:40 PM, Terwilliger, Thomas Charles <terwilliger@lanl.gov> wrote:
Hi DDDWG members!
As Wladek has mentioned, we have set up a small working group to develop standards for metadata for diffraction images. The members of the working group are Andreas Forster, Wladek Minor, and Loes Kroon-Batenburg.
Wladek has drafted a starting point for these standards and I have attached an edited version. Your comments are welcome and I have included emails for the working group members so that they can see your comments!
All the best,
Tom T
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Andreas Förster, Ph.D.
MX Application Scientist, Scientific Sales

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