Old notices
These pages collect together notices posted on the IUCr web site in past years. They are retained for archival interest, but there is no guarantee (or likelihood) that many of the web links found in these notices will still be active.
Special issue on high-resolution X-ray diffraction and imaging
The latest virtual special issue of Journal of Applied Crystallography with Guest Editors Virginie Chamard (Institute Fresnel) and Václav Holý (Charles University in Prague) http://journals.iucr.org/special_issues/2017/xtop2016/ features a selection of original contributions from the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), which was held in Brno, Czech Republic, in September 2016. The topics of the published articles (all of which are open access) cover the broad spectrum of problems discussed during the conference, highlighting in particular four specific X-ray techniques: X-ray Bragg diffraction, small-angle scattering and reflectivity, X-ray diffraction imaging, and coherent (phase-sensitive) X-ray imaging.
In the Bragg diffraction group, the articles are devoted to high-resolution diffraction from thin layers, diffraction from surface acoustic waves, diffraction from protein crystals and X-ray diffraction theory.
Small-angle scattering is represented by articles dealing with ultra-small-angle scattering from precipitates in metallic alloys and X-ray reflection imaging.
The X-ray diffraction imaging papers present the application of X-ray topography techniques to various types of samples, such as silicon dies in integrated circuit packages, synthetic diamond crystals and subsurface layers in semiconductor epitaxial layers, as well as a report on how X-ray diffraction was combined with a scanning mode to investigate ferroelectric domains in epitaxial layers.
Coherent (phase-sensitive) X-ray imaging is presented in articles focused on the investigation of the near-field wavefront produced by a waveguide, on the issue of resolution in holographic and coherent diffraction imaging, and on the coherent imaging of a single semiconductor nanorod.
