Advanced High-Resolution Electron Microscopy, 23 December 2002
There were in total 100 Chinese participants attending the workshop/school. Ten experts were invited to give main lectures: Jiang-hua Chen (Delft University, The Netherlands), Jin Zou (Sydney University, Australia), Di Wang (Fritz-Haber Institute, Berlin, Germany), Fu-rong Chen (Tsinghua University, Taiwan), Rong Wang (Peking University of Science & Technology, People's Republic of China), Xiao-jing Wu (Fudan University, People's Republic of China), Man-ling Sui [Institute of Metals, Chinese Academy of Sciences (CAS)], Hai-fu Fan, Fang-hua Li and Huai-bin Wang (Institute of Physics, CAS). The workshop/school aimed at offering a forum to communicate new theories and new methods in investigating crystal structures and microstructures with a resolution higher than the resolution of the electron microscope. The topics of this workshop/school mainly concentrated on solving the inverse problem in high-resolution electron microscopy (HREM) by image processing. Two image processing techniques that were studied most extensively in the People's Republic of China and Europe, respectively, and the technique recently developed in Taiwan were introduced including theories, methods and applications. This indicated a new prospect in the application of HREM. In addition, the advantages and problems of spherical-aberration-corrected HREM were discussed.
This workshop/school offered a good opportunity to all participants to learn about the fundamental theory and/or recent advances in the field of HREM, and also to report their achievements.