CUFOUR
Entered: Thu Oct 21 2010
Operating systems: HPUX
Type:
Languages:
Distribution: Commercial
Application fields: Characterization; Electron microscopy
Description: Many-beam dynamical calculation (Schu0062lin and Stadelmann, 1987) of CTEM and CBED contrast of some defects (dislocations, planar faults, interfaces) in cubic, tetragonal and hexagonal crystals.
References: http://cecm.insa-lyon.fr/CIOL/cufour.html
Last updated: 15 Oct 2021