Entered: Fri Apr 15 2016

Operating systems:

Type: Source

Languages: C++

Distribution: Free

Application fields: Characterization

Bibliography: Ruffoni, M.P. (2009). J. Synchrotron Rad. 16, 591-594

Description: Differential EXAFS is a new XAS technique dedicated to directly measuring the tiny atomic displacements that arise from such strain-inducing phenomena as magnetostriction, piezoelectricity and thermal expansion. These new experiments have presented the need for new analysis tools to extract and quantify the measured atomic strains, a need that has been addressed by the development of the DEXA code.



Last updated: 15 Apr 2016