DEXA
Entered: Fri Apr 15 2016
Operating systems:
Type: Source
Languages: C++
Distribution: Free
Application fields: Characterization
Bibliography: Ruffoni, M.P. (2009). J. Synchrotron Rad. 16, 591-594
Description: Differential EXAFS is a new XAS technique dedicated to directly measuring the tiny atomic displacements that arise from such strain-inducing phenomena as magnetostriction, piezoelectricity and thermal expansion. These new experiments have presented the need for new analysis tools to extract and quantify the measured atomic strains, a need that has been addressed by the development of the DEXA code.
References: http://www.sourceforge.net/
Last updated: 15 Oct 2021