High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data

J. Appl. Cryst. (2004). 37, 883–889 [doi:10.1107/S0021889804023349]

This article demonstrates the feasibility of making strain measurements with both high spatial and strain resolution in bulk (engineering) components. The experiments were undertaken using energy dispersive X-ray diffraction with synchrotron X-rays between 100 and 300 keV on beam line ID15A at the ESRF. The data analysis was improved by using a multiple-peak Pawley-type refinement on the recorded spectra with an asymmetric peak profile. An important area of application is the characterisation of stress fields around crack tips in bulk components.

A. Steuwer, J. R. Santisteban, M. Turski, P. J. Withers and T. Buslaps