Individual GaAs nanorods imaged by coherent X-ray diffraction
Coherent diffraction imaging in combination with a nano-focused X-ray beam was used to identify both shape and strain state of individual hexagonally shaped GaAs nanorods within a periodic nanorod array. From the three-dimensional intensity distribution around a Bragg peak in reciprocal space, differences in shape and strain of different nanorods could be resolved using phase-retrieval algorithms. The method is promising for the destruction-free analysis of nanoobjects.
A. Biermanns, A. Davydok, H. Paetzelt, A. Diaz, V. Gottschalch, T. H. Metzger and U. Pietsch
![[GaAs nanorod]](https://www.iucr.org/__data/assets/image/0011/28595/JRS.jpg)
Three-dimensional coherent diffraction pattern of a single GaAs nanorod. Size, shape and strain of the individual object (inset) can be derived from the intensity distribution.
