
Meeting report
X-ray structure school
![[X-ray school]](https://www.iucr.org/__data/assets/image/0018/21762/xraystructureschool.jpg)
Various topics were covered in the school, which was divided into two parts. The first part was devoted to the fundamental theory of crystallography, data collection , data reduction, structure solution, least-squares refinements and demonstration of the Cambridge Structural Database. The second part was related to some difficult problems as absolute structure determination, modulated structures and twinning. Practical work sessions concerning the structure solution computer programs (Shelxl, Crystals, SIR, MoPro) were organised as well as hands on sessions. Most lectures and all tutorials were taught using the French language.
Lecturers and topics included Direct and Reciprocal Space (N. Ghermani, France) Crystal Symmetry (H. Flack, Switzerland), Scattering and Structure Factors (C. Lecomte, France), Data Reduction (S. Pillet, France), From Punct to two Dimensional Detectors (M. Pierrot, France), Direct Methods (C. Giacovazzo, Italy), Patterson Analysis (J.P. Legros, France), New Developments in Direct Methods (H. Gornitzka, France). Incommensurate Structures (V. Petricek, Czech Republic), Least-Squares refinements (D. Watkin, UK), Introduction to twinning (S. Parsons, UK), Absolute Structure and Absolute Configuration (H. Flack, Switzerland), Interpretation of Results (L. Ricard, France), Data Deposition, CIF (J.C. Daran, France), Cambridge Structural Database (K. Lipscomb, F. Allen, UK), Multipolar Refinement and Charge Density Analysis (C. Lecomte, France).The atmosphere was excellent, with a lot of discussions between scholars and students around coffee, beer and glasses of French wine.
There were 70 participants coming not only from France, but also from Morocco, Algeria, Tunisia, Croatia and the Ivory Coast.