Crystallographic resources


Entered: Tue Jan 04 2011

Operating systems: MS Windows


Languages: C++

Distribution: Shareware

Application fields: Diffraction

Bibliography: Desgreniers, S. & Lagarec, K. (1998). J. Appl. Cryst. 31, 109-110.

Description: XRDA 3.1 is meant to accomplish the complete handling and analysis of X-ray diffraction data, recorded in either the energy-dispersive or angle-dispersive mode. The analysis per se is done following six major steps: (1) peak profile fittings using preset common profile functions or user-defined profile functions (2) organization of X-ray diffraction lines under different groups (phases) if a pattern is one of a multi-phase sample (3) assignment of Miller indices to the fitted lines (4) definition of the Bravais lattice and the atomic positions for each phase as required (5) lattice parameter fitting and diffraction intensity calculation.


Last updated: 15 Oct 2021