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Electron Diffraction and Imaging at Surfaces

Scientists gathered at a winter workshop in warm Scottsdale, Arizona, to focus on surface analysis based on electron diffraction and imaging. Sessions on diffraction and holography gave an overview of structure determination using photoelectrons, Auger electrons, Kikuchi electrons, and low-energy-electron-diffraction patterns, with key presentations given by D. K. Saldin (Milwaukee), C. S. Fadley (Berkeley and Davis), and S. Y. Tong (Hong Kong and Milwaukee). Recent developments in structure determination with low-energy electron diffraction were reviewed by W. Moritz (Munich), M. A. Van Hove (Berkeley), and M. Henzler (Hannover). Transmission electron microscopy and diffraction were the topics of sessions with key presentations by J. M. Cowley (Tempe), J. M. Gibson (Urbana), and K. Takayanagi (Yokohama). Other presentations covered reflection electron microscopy (K. Yagi, Tokyo and A. L. Aseev, Novosibirsk), a point-reflection microscope (J. C. H. Spence, Tempe), low-energy electron microscopy (R. Tromp, Yorktown Heights and I. S. T. Tsong, Tempe). Reflection high-energy electron diffraction received particular attention as a developing tool; theoretical methods of stimulating RHEED intensities were described by P. Maksym (Leicester), and careful comparisons were made by A. Ichimiya (Nagoya) in a revealing round robin that pointed at areas needing further progress. Experimental developments were highlighted by H. A. Atwater (Pasadena), M. Ichikawa (Tsukuba), and A. Ichimiya (Nagoya). The local organizers were J. C. H. Spence and S. Willison of Arizona State U. Sponsors included the IUCr (Young Scientist Award), the U. S. Dept. of Energy, Lawrence Berkeley Natl Lab. Arizona State U., Eiko Engineering, Ltd., JEOL, Inc., Matsushita Res. Inst., Tokyo, Inc. NEC Corp., Japan, Toshiba Corp., and Toyota Motor Corp. The Proceedings will be published in a special issue of Surface Review and Letters.

M. A. Van Hove
Workshop Chair, Berkeley