1998 Denver X-ray Conference
The technical program offered two days of tutorial workshops, followed by three days of invited, contributed and poster presentations on a variety of topics covering both X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) techniques. The 1998 Birks Award was presented to Horst Ebel of Technische U. Wien, Austria, recognizing his excellence in the field of Xray fluorescence spectrometry. Herb Göbel of Siemens AG, Germany, received the J.D. Hanawalt Award for his important recent contribution to the field of X-ray powder diffraction and presented a lecture “High Temperature Studies with Oven Cameras”. Sessions covered X-ray Optics; XRF Detection Limits - How Low Can We Go?; Synchrotron Applications of Powder Diffraction; X-ray Absorption Spectroscopy; Recent Developments in Instrumentation and Detectors; and XRD & XRF; Data Treatment; Thin Films: Orientation, Stress, Thickness; Innovative Rietveld Analysis; Quantitative Phase Analysis; and Materials Process Characterization. For more details and future programs visit the Denver Conference website: www.dxcicdd.com.
The proceedings of the Denver X-Ray Conference, Advances in X-ray Analysis, Volume 42, will be produced on a CD-ROM by ICDD; the hard copy will be published by Plenum.Dave Taylor
From the BCA Newsletter, Dec. 1998