Meeting report

1998 Denver X-ray Conference

[logo b]
In 1951, the U. of Denver held a one-day symposium on the use of X-rays and their importance in modern research. The Denver X-Ray Conference has grown to provide a leading forum for scientists working in the field of X-ray materials analysis. The 47th conference, held in Colorado Springs, CO, Aug., 1998, was organized by a committee of eleven and run by ICDD. The conference hosted 389 registered attendees and 275 exhibitors who represented 39 companies. The program and abstract book ran to over 250 pages.

The technical program offered two days of tutorial workshops, followed by three days of invited, contributed and poster presentations on a variety of topics covering both X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) techniques. The 1998 Birks Award was presented to Horst Ebel of Technische U. Wien, Austria, recognizing his excellence in the field of Xray fluorescence spectrometry. Herb Göbel of Siemens AG, Germany, received the J.D. Hanawalt Award for his important recent contribution to the field of X-ray powder diffraction and presented a lecture “High Temperature Studies with Oven Cameras”. Sessions covered X-ray Optics; XRF Detection Limits - How Low Can We Go?; Synchrotron Applications of Powder Diffraction; X-ray Absorption Spectroscopy; Recent Developments in Instrumentation and Detectors; and XRD & XRF; Data Treatment; Thin Films: Orientation, Stress, Thickness; Innovative Rietveld Analysis; Quantitative Phase Analysis; and Materials Process Characterization. For more details and future programs visit the Denver Conference website:

The proceedings of the Denver X-Ray Conference, Advances in X-ray Analysis, Volume 42, will be produced on a CD-ROM by ICDD; the hard copy will be published by Plenum.

Dave Taylor
From the BCA Newsletter, Dec. 1998