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2008 McMurdie Award

[Jeffrey Dann and Thomas Blanton] Jeffrey Dann (left) with ICDD Chairman Thomas Blanton
The International Centre for Diffraction Data is pleased to announce that long-time ICDD member, Jeffrey Dann of Global Tungsten & Powders (formerly OSRAM Sylvania), Tonawanda, PA, was named as the 2008 McMurdie Award Recipient. The award itself was presented at the 57th Annual Denver X-ray Conference, held in Denver, Colorado. The award recognizes distinguished work which improves the Powder Diffraction FileTM (PDF).
Since 1976, Jeff has been an active participant of the Metals & Alloys Subcommittee and Task Team and has served as Chairman of the Target Systems Subcommittee responsible for identifying materials missing from the PDF and making recommendations to the Grant-in-Aid Committee to promote proposals focusing on these missing phases.