Crystallographic Information Framework

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CIF_CORE > DIFFRACTION > REFLNS > REFLNS_CLASS

Index

Core dictionary version 3.0.14

_reflns_class.d_res_high

Name:
_reflns_class.d_res_high

Alias:
_reflns_class_d_res_high

Definition:

   
     Highest resolution for the reflections in this class.
     This corresponds to the smallest interpanar d value.

Type: Real

Units: angstroms


The permitted range is 0.0 → infinity

Category:
reflns_class


International Tables for Crystallography

Volume G: Definition and exchange of crystallographic data

First online edition (2006)

Edited by S. R. Hall and B. McMahon

An essential guide and reference to CIF for programmers, data managers handling crystal-structure information and practising crystallographers.